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Publications

John D. Cressler
Georgia Institute of Technology

M. Hosseinzadeh, J.W. Teng, B.L. Ringel, P.J. Francis, J.P. Heimerl, G.N. Tzintzarov, A. Little, J. Bonsall, S.D. LaLumondiere, D.M. Monahan, and J.D. Cressler, “Total-Ionizing-Dose Effects in Integrated Silicon Photonics Mach-Zehnder Modulators Using Localized X-Ray Pulses,” IEEE Transactions on Nuclear Science, vol. 72, pp. 1172-1180, 2025, DOI 10.1109/TNS.2024.3496297.

Mhosseinzadeh_TNS_2024_submittedDownload

M. Hosseinzadeh, J.W. Teng, B.L. Ringel, D. Nergui, A. Ildefonso, A. Khachatrian, D. McMorrow, and J.D. Cressler, “Analysis of Optical Single-Event Transients in Integrated Si Photonics Mach-Zehnder Modulators for Space-based Optical Communications,” IEEE Transactions on Nuclear Science, vol. 71, pp. 736-743, 2024.

Mhosseinzadeh_TNS_2023_Resubmission-1Download

Peter J. Delfyett
University of Central Florida CREOL, College of Optics and Photonics

Pericherla, Srinivas & Trask, Lawrence & Shirpurkar, Chinmay & Bhardwaj, Ashish & Hoefler, Gloria & Delfyett, Peter. (2024). Stabilization of an InP Mode-Locked Laser PIC Through Simultaneous Optical Filtering and Self-Injection Locking Using a Fabry-Perot Etalon. Journal of Lightwave Technology. PP. 1-7. 10.1109/JLT.2024.3366092.

2024 – Srini – Stabilization of an InP mode-locked laser PIC through simultaneous optical filtering and self-injection locking using a Fabry-Perot etalonDownload

Trask, Lawrence & Pericherla, Srinivas & Delfyett, Peter. (2025). Self-oscillating, self-stabilizing, and self-referenced electro-optic comb. Optics Express. 33. 3429-3437. 10.1364/OE.535014

2025 – Lawrence Self oscillating self referenced electro optic comb oe-33-2-3429Download

Sasan Fathpour
University of Central Florida CREOL, College of Optics and Photonics

F. A. Juneghani, M. G. Vazimali, J. Zhao, X. Chen, S. T. Le, H. Chen, E. Ordouie, N. K. Fontaine, and S. Fathpour, “Thin film lithium niobate optical modulators with an extrapolated bandwidth of 170 GHz,”‐Advanced Photonics Research, vol. 4, p. 2200216, October 2022.

170 GHz Thin‐Film Lithium Niobate Optical ModulatorsDownload

F. A. Juneghani, M. G. Vazimali, K. F. Lee, E. Velazquez, X. Gong, G. S. Kanter, and S. Fathpour, “Wireless microwave-to-optical conversion on thin-film lithium niobate,” in Journal of Lightwave Technology, vol. 42, no. 16, pp. 5583-5590, Aug. 2024.

Wireless_Microwave-to-Optical_Conversion_on_Thin-Film_Lithium_Niobate PDFADownload

Stephen E. Ralph
Georgia Institute of Technology

J. M. Hiesener, R. P. Pesch, and S. E. Ralph, “On topology optimization strategies for ultra-compact high contrast grating design,” IEEE Photonics Technology Letters, vol. 36, no. 9, pp. 597–600, 2024. DOI: 10.1109/LPT.2024.1234567.

On_Topology_Optimization_Strategies_for_Ultra-Compact_High_Contrast_Grating_DesignDownload

M. J. Probst, A. Khurana, J. B. Slaby, A. M. Hammond, and S. E. Ralph, “Fabrication tolerant multi-layer integrated photonic topology optimization,” Optics Express, vol. 32, no. 18, pp. 31448-31462, 2024, Optica Publishing Group. DOI: 10.48550/arXiv.2404.07104.

Fabrication_Tolerant_Multi_Layer_Integrated_Photonic_Topology_OptimizationDownload

Robert A. Reed
Vanderbilt University

K. Arnold1, H. Dattilo1, E. Zhang, M. McCurdy, S. Musibau2, M. Berciano, A. Tsiara, D. Linten, K. Croes, J. Van Campenhout, R. Schrimpf, D. Fleetwood, R. A. Reed, S. Weiss, “Displacement Damage and Ionization Effects on Waveguide-Integrated Germanium-Silicon PIN Photodiodes,” IEEE Transactions on Nuclear Science, IEEE Transactions on Nuclear Science, Vol. 72, No. 4, pp 1181-1190, Apr. 2025. DOI: 10.1109/TNS.2025.3532086

Displacement_Damage_and_Ionization_Effects_on_Waveguide-Integrated_Germanium-Silicon_p-i-n_PhotodiodesDownload

James M Trippe, Brian D Sierawski, Grant Mayberry, Hannah M Dattilo1, Sokrates T Pantelides, Daniel M Fleetwood, Ronald D Schrimpf, Lloyd W Massengill, Robert A Reed, “Effectiveness of NIEL as a Predictor of Single Event Displacement Damage Effects in CMOS Circuits,” IEEE Transactions on Nuclear Science, IEEE Transactions on Nuclear Science, Vol. 72, No. 4, pp 1384-1394, Apr. 2025. [Outstanding Conference Paper Award]. DOI: 10.1109/TNS.2024.3520493

Effectiveness_of_NIEL_as_a_Predictor_of_Single-Event_Displacement_Damage_Effects_in_CMOS_CircuitsDownload

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